3D Atom Probe Tomography Study on Segregation of Yttrium in Modified Al-Si Alloys

被引：5

作者：

De-Giovanni, Mario ^{[1
]}

Alam, Talukder ^{[2
]}

Banerjee, Rajarshi ^{[2
]}

Srirangam, Prakash ^{[1
]}

机构：

[1] Univ Warwick, WMG, Coventry CV4 7AL, W Midlands, England

[2] Univ North Texas, Dept Mat Sci & Engn, Denton, TX 76203 USA

来源：

JOM | 2018年 / 70卷 / 09期

关键词：

EUTECTIC SI; HEAT-TREATMENT; STRONTIUM; SR;

D O I：

10.1007/s11837-018-2909-x

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Yttrium segregation behavior in Al-Si alloys has been studied using the three-dimensional atom probe tomography technique. Al-Si alloys were prepared by casting method, and yttrium was added to modify the eutectic silicon morphology in these alloys. The results indicated that yttrium is preferentially located within the Si phase, with the highest concentration at the interface between eutectic Al and eutectic Si.

引用

页码：1765 / 1770

页数：6

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