Comment on "Electrostatic force microscopy on oriented graphite surfaces: Coexistence of insulating and conducting behaviors" - Reply

被引：8
|
作者：
Lu, Yonghua
Munoz, M.
Steplecaru, C. S.
Hao, Cheng
Bai, Ming
Garcia, N.
Schindler, K.
Spoddig, D.
Esquinazi, P.
机构：
[1] CSIC, Lab Fis Sistemas Pequenos & Nanotecnol, Madrid 28006, Spain
[2] Univ Leipzig, Div SUM, D-04103 Leipzig, Germany
来源：
PHYSICAL REVIEW LETTERS | 2007年 / 98卷 / 26期
关键词：
D O I：
10.1103/PhysRevLett.98.269702
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页数：1
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