A scalable GaN HEMT large-signal model for high-efficiency RF power amplifier design

被引:30
|
作者
Xu, Yuehang [1 ]
Fu, Wenli [2 ]
Wang, Changsi [1 ]
Ren, Chunjiang [3 ]
Lu, Haiyan [3 ]
Zheng, Weibin [4 ]
Yu, Xuming [4 ]
Yan, Bo [1 ]
Xu, Ruimin [1 ]
机构
[1] Univ Elect Sci & Technol China, Fundamental Sci EHF Lab, Chengdu 611731, Peoples R China
[2] China Acad Space Technol Xian, Natl Key Lab Sci & Technol Space Microwave, Xian 710100, Peoples R China
[3] Sci & Technol Monolith Integrated Circuits & Modu, Nanjing 210016, Jiangsu, Peoples R China
[4] Nanjing Elect Devices Inst, Nanjing 210016, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
scalable model; power amplifier; large-signal empirical model; GaN HEMT; ALGAN/GAN HEMTS;
D O I
10.1080/09205071.2014.947440
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a large-signal empirical model for GaN HEMT devices using an improved Angelov drain current formulation with self-heating effect and a modified non-linear capacitance model. The established model for small gate-width GaN HEMTs is validated by on-wafer load-pull measurements up to 14GHz. Moreover, a scalable large-signal model is presented by adding scalable parameters to drain-source current and non-linear capacitance equations. The scalable model of a 1.25mm GaN HEMT has been employed to design a class-AB power amplifier for validation purposes. The results show that good agreement has been achieved between the simulated and measured results with 37.2 dBm saturation output power (P-sat) and 58% maximum power-added-efficiency at 3GHz.
引用
收藏
页码:1888 / 1895
页数:8
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