Nonlinear reflectivity of semiconductor microcavities in the weak- and strong-coupling regimes: Experiment and theory

We use an entirely classical model to describe the nonlinear properties of semiconductor microcavities in both the weak-and strong-coupling regimes, as measured in a series of spectrally and temporally resolved pump-probe experiments. The model, which follows on from a linear dispersion model previously used to describe the linear properties, provides very good qualitative agreement between a wide range of experimental and theoretical spectra. We also find that on the time scales of our observation (tens of picoseconds), the model provides an excellent description of the complex temporal evolution of the nonlinear spectra. [S0163-1829(98)05816-0].