A phenomenological aging model for combined thermal and electrical stress

被引：26
|
作者：
Gjaerde, AC [1 ]
机构：
[1] Norwegian Elect Power Res Inst, Trondheim, Norway
来源：
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 1997年 / 4卷 / 06期
关键词：
D O I：
10.1109/94.654574
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new aging model for thermal-electrical aging is proposed. The combined effect of temperature and partial discharges was investigated using epoxy samples. The new model is based on measurements of void gas pressure and time-to-breakdown experiments. This approach is quite opposite to other aging models in that the new model is based on measurements of a physical parameter which is a function of the aging rate itself.
引用
收藏
页码：674 / 680
页数：7
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