A phenomenological aging model for combined thermal and electrical stress

被引：26

作者：

Gjaerde, AC ^{[1
]}

机构：

[1] Norwegian Elect Power Res Inst, Trondheim, Norway

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 1997年 / 4卷 / 06期

关键词：

D O I：

10.1109/94.654574

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new aging model for thermal-electrical aging is proposed. The combined effect of temperature and partial discharges was investigated using epoxy samples. The new model is based on measurements of void gas pressure and time-to-breakdown experiments. This approach is quite opposite to other aging models in that the new model is based on measurements of a physical parameter which is a function of the aging rate itself.

引用

页码：674 / 680

页数：7

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