Effect of crystallinity on electrochromic mechanism of LixWO3 thin-films

被引:81
作者
Lee, SH
Seong, MJ
Cheong, HM
Ozkan, E
Tracy, EC
Deb, SK
机构
[1] Ctr Basic Sci, Natl Renewable Energy Lab, Golden, CO 80401 USA
[2] Sogang Univ, Seoul 121742, South Korea
[3] Istanbul Tech Univ, TR-80626 Istanbul, Turkey
关键词
LixWO3 thin films; electrochromic mechanism; intercalation;
D O I
10.1016/S0167-2738(02)00732-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Intercalation of lithium lions in amorphous tungsten oxide films and in monoclinic polycrystalline tungsten oxide films has been studied using electrochemical analyses and Raman spectroscopy. We present direct evidence for W5+ 5d-electron localization in amorphous tungsten oxide films upon lithium ion and electron intercalation by comparing the Raman spectra of amorphous and crystalline Jungsten oxide films.' We observe that when lithium ions and electrons are inserted into the crystalline tungsten oxide films, the monoclinic structure of the material proceeds to. progressively increased symmetry. On the other hand, when lithium ions and electrons are inserted into amorphous tungsten oxide films, the inserted electrons are localized in W5+ sites and polarize their surrounding lattice to form small polarons: The extra Raman peaks due to the W5+-O single bonds and W5+=O double bonds appear at 330 and 450 cm(-1), respectively. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:447 / 452
页数:6
相关论文
共 15 条
[11]   ELECTROCHROMISM OF WO3 LIALF4 LILN THIN-FILM OVERLAYERS [J].
OI, T ;
MIYAUCHI, K ;
UEHARA, K .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1823-1823
[12]  
Salje E., 1980, High Temperatures - High Pressures, V12, P213
[13]  
Schirmer O., 1980, J PHYS C SOLID STATE, V41, P479
[14]   CHARACTERIZATION OF EVAPORATED AMORPHOUS WO3 FILMS BY RAMAN AND FTIR SPECTROSCOPIES [J].
SHIGESATO, Y ;
MURAYAMA, A ;
KAMIMORI, T ;
MATSUHIRO, K .
APPLIED SURFACE SCIENCE, 1988, 33-4 :804-811
[15]   LITHIUM INTERCALATION INTO WO3 AND THE PHASE-DIAGRAM OF LIXWO3 [J].
ZHONG, Q ;
DAHN, JR ;
COLBOW, K .
PHYSICAL REVIEW B, 1992, 46 (04) :2554-2560