High-resolution x-ray topography and diffraction study of bulk regular domain structures in LiNbO3 crystals

Bulk regular domain structures created in a LiNbO3 crystal by aftergrowth thermoelectrical treatment technique were studied by high-resolution x-ray diffraction and topography. Topographic contrast can be observed between neighboring domains and is related to the difference in the direction of spontaneous polarization vectors. In the Y-cut case, x-ray topography allows the determination of positively or negatively charged domain boundaries. It is also shown that x-ray diffraction can be used to study elastic deformation around domain walls. (C) 2004 American Institute of Physics.