Andreev reflection and incoherent spin-polarized transport in ferromagnetic semiconductor/d-wave superconductor/ferromagnetic semiconductor tunnel junctions with {110} interfaces
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作者:
Tao, Y. C.
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Nanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R ChinaNanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R China
Tao, Y. C.
[1
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Liu, H.
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Nanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R ChinaNanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R China
Liu, H.
[1
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Hu, J. G.
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Yangzhou Univ, Dept Phys, Yangzhou 225002, Peoples R ChinaNanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R China
Hu, J. G.
[2
]
机构:
[1] Nanjing Normal Univ, Dept Phys, Nanjing 210097, Peoples R China
[2] Yangzhou Univ, Dept Phys, Yangzhou 225002, Peoples R China
The hole spin accumulation and spin-polarized transport in ferromagnetic semiconductor (FS)/d-wave superconductor (SC)/FS tunnel junctions with (110) interfaces are studied by using four-component Bogoliubov-de Gennes equations, in which the Andreev reflection and four-subband model for the FS are taken into account. It is found that due to the interplay of the d-wave SC and FS, the nonequilibrium hole spin accumulation, differential conductance, and tunneling magnetoresistance exhibit a rich dependence on the Andreev reflection, strengths of potential scattering at the interfaces, mismatches in the effective mass and band between the FS and SC, and types of incident holes, which is much different from that in FS/s-wave SC/FS tunneling junctions. Particularly, it is demonstrated that the differential conductance can be negative in both ferromagnetic and antiferromagnetic alignments for not only incident heavy holes but also incident light holes, and the variations in both the energy gap with temperature and hole spin accumulation with bias voltage can display a twofold behavior due to the Andreev reflection. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3410926]
机构:
Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
MIT, Francis Bitter Natl Magnet Lab, Cambridge, MA 02139 USAHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Yoon, Kapsoo
Kim, Kiwoong
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Kim, Kiwoong
Koo, Jahyun
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Koo, Jahyun
Yang, Jungyup
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Yang, Jungyup
Do, YoungHo
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Do, YoungHo
Kwak, Junesik
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
Kwak, Junesik
Hong, Jinpyo
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea