Femtosecond laser-induced periodic surface structures on titanium nitride coatings for tribological applications

被引:48
作者
Bonse, J. [1 ]
Kirner, S. V. [1 ]
Koter, R. [1 ]
Pentzien, S. [1 ]
Spaltmann, D. [1 ]
Krueger, J. [1 ]
机构
[1] Bundesanstalt Mat Forsch & Prufung BAM, Unter Eichen 87, D-12205 Berlin, Germany
关键词
Laser-induced periodic surface structures (LIPSS); Femtosecond laser ablation; Titanium nitride films; Friction; Wear; THIN-FILMS; TIN; ABLATION; SILICON; FRICTION; STATE; CRN;
D O I
10.1016/j.apsusc.2016.10.132
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Titanium nitride (TiN) was coated on different substrate materials, namely pure titanium (Ti), titanium alloy (Ti6AI4V) and steel (100Cr6), generating 2.5 mu m thick TiN layers. Using femtosecond laser pulses (30 fs, 790 nm, 1 kHz pulse repetition rate), large surface areas (5 rnm x 5 mm) of laser-induced periodic surface structures (LIPSS) with sub-wavelength periods ranging between 470 nm and 600 nm were generated and characterized by optical microscopy (OM), white light interference microscopy (WLIM) and scanning electron microscopy (SEM). In tribological tests, coefficients of friction (COF) of the nanostructured surfaces were determined under reciprocating sliding conditions (1 Hz, 1.0N normal load) against a 10-mm diameter ball of hardened 100Cr6 steel during 1000 cycles using two different lubricants, namely paraffin oil and engine oil. It turned out that the substrate material, the laser fluence and the lubricant are crucial for the tribological performance. However, friction and wear could not be significantly reduced by LIPSS on TiN layers in comparison to unstructured TiN surfaces. Finally, the resulting wear tracks on the nanostructured surfaces were investigated with respect to their morphology (OM, SEM), depth (WLIM) and chemical composition by energy dispersive X-ray spectroscopy (EDX) and, on one hand, compared with each other, on the other hand, with non-structured TiN surfaces. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:572 / 579
页数:8
相关论文
共 26 条
[1]  
[Anonymous], 1993, MAT PROPERTIES HDB T
[2]   SURFACE ELECTROMAGNETIC-WAVES IN OPTICS [J].
BONCHBRUEVICH, AM ;
LIBENSON, MN ;
MAKIN, VS ;
TRUBAEV, VV .
OPTICAL ENGINEERING, 1992, 31 (04) :718-730
[3]   Tribological performance of sub-100-nm femtosecond laser-induced periodic surface structures on titanium [J].
Bonse, J. ;
Hoehm, S. ;
Koter, R. ;
Hartelt, M. ;
Spaltmann, D. ;
Pentzien, S. ;
Rosenfeld, A. ;
Krueger, J. .
APPLIED SURFACE SCIENCE, 2016, 374 :190-196
[4]   Tribological performance of femtosecond laser-induced periodic surface structures on titanium and a high toughness bearing steel [J].
Bonse, J. ;
Koter, R. ;
Hartelt, M. ;
Spaltmann, D. ;
Pentzien, S. ;
Hoehm, S. ;
Rosenfeld, A. ;
Krueger, J. .
APPLIED SURFACE SCIENCE, 2015, 336 :21-27
[5]   Femtosecond laser-induced periodic surface structures on steel and titanium alloy for tribological applications [J].
Bonse, J. ;
Koter, R. ;
Hartelt, M. ;
Spaltmann, D. ;
Pentzien, S. ;
Hoehm, S. ;
Rosenfeld, A. ;
Krueger, J. .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 117 (01) :103-110
[6]   Femtosecond laser-induced removal of silicon nitride layers from doped and textured silicon wafers used in photovoltaics [J].
Bonse, J. ;
Mann, G. ;
Krueger, J. ;
Marcinkowski, M. ;
Eberstein, M. .
THIN SOLID FILMS, 2013, 542 :420-425
[7]   Femtosecond laser-induced periodic surface structures [J].
Bonse, J. ;
Krueger, J. ;
Hoehm, S. ;
Rosenfeld, A. .
JOURNAL OF LASER APPLICATIONS, 2012, 24 (04)
[8]   Femtosecond pulse laser processing of TiN on silicon [J].
Bonse, J ;
Rudolph, P ;
Krüger, J ;
Baudach, S ;
Kautek, W .
APPLIED SURFACE SCIENCE, 2000, 154 (154) :659-663
[9]   Femtosecond laser damage of a high reflecting mirror [J].
Bonse, J ;
Baudach, S ;
Kautek, W ;
Welsch, E ;
Krüger, J .
THIN SOLID FILMS, 2002, 408 (1-2) :297-301
[10]   Chemical, morphological and accumulation phenomena in ultrashort-pulse laser ablation of TiN in air [J].
Bonse, J ;
Sturm, H ;
Schmidt, D ;
Kautek, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2000, 71 (06) :657-665