Adaptive aberration correction in a two-photon microscope

被引：134
|
作者：
Neil, MAA
Juskaitis, R
Booth, MJ
Wilson, T
Tanaka, T
Kawata, S
机构：
[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
[2] Osaka Univ, Dept Appl Phys, Suita, Osaka 5650871, Japan
来源：
JOURNAL OF MICROSCOPY | 2000年 / 200卷 / 02期
关键词：
adaptive aberration correction; confocal microscopy; two-photon microscopy;
D O I：
10.1046/j.1365-2818.2000.00770.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferroelectric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (x-z) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 mum in an aqueous specimen.
引用
收藏
页码：105 / 108
页数：4
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