Random electron diffraction tomography for structure analysis of pharmaceuticals

被引:0
作者
Nikolopoulos, Stavros [1 ]
Galanis, Athanasios S. [1 ]
Vallcorba, Oriol [2 ]
Eggeman, Alex [3 ]
Das, Partha Pratim [1 ]
Abrahams, Jan Pieter [4 ]
Rauch, Edgar [5 ]
Midgley, Paul A. [3 ]
Gemmi, Mauro [6 ]
机构
[1] NanoMEGAS SPRL, Brussels, Belgium
[2] ALBA, Expt Div MSPD Beamline, Barcelona, Spain
[3] Univ Cambridge, Dept Mat Sci & Met, Cambridge, England
[4] Univ Basel, Basel, Switzerland
[5] Grenoble INP, CNRS, SIMAP Lab, Grenoble, Switzerland
[6] Ist Italiano Tecnol, NEST, Ctr Nanotechnol Innovat, Pisa, Italy
来源
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2017年 / 73卷
关键词
Precession Electron Diffraction; Diffraction Tomography; pharmaceuticals;
D O I
10.1107/S2053273317085941
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
MS058.P03
引用
收藏
页码:C980 / C980
页数:1
相关论文
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