共 48 条
[1]
CHEMICAL-ANALYSIS OF INORGANIC AND ORGANIC-SURFACES AND THIN-FILMS BY STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS)
[J].
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH,
1994, 33 (10)
:1023-1043
[4]
DESORPTION IONIZATION MASS-SPECTROMETRY
[J].
JOURNAL OF MASS SPECTROMETRY,
1995, 30 (02)
:233-240
[7]
COOKS RG, 1991, RAPID COMMUN MASS SP, V5, P93
[8]
COOKS RG, 2003, Patent No. 20030226963
[9]
Dongre AR, 1996, J MASS SPECTROM, V31, P339