On-line error detection and fast recover techniques for dependable embedded processors - Introduction

[1] ABRAMOVICI M, 1990, DIGITAL SYSTEM TESTI

[2] ACKEN JM, 1983, 1983 DESIGN AUTOMATI, P717

[3] AMENDOLA A, 1996, IEEE EURO VHDL 96 GE

[4] [Anonymous], IDDQ TESTING VLSI CI

[5] [Anonymous], P IEEE INT TEST C

[6] [Anonymous], 1998, COMPUTER ORG DESIGN

[7] AUER A, SCHALTUNGSTEST BOUND

[8] BEHLING A, 2000, THESIS BTU COTTBUS G

[9] Benso A., 1998, Annual Reliability and Maintainability Symposium 1998 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.98CH36161), P383, DOI 10.1109/RAMS.1998.653808

[10] BENSO A, 1998, J UNIVERS COMPUT SCI, V5, P693

[1] ABRAMOVICI M, 1990, DIGITAL SYSTEM TESTI

[2] ACKEN JM, 1983, 1983 DESIGN AUTOMATI, P717

[3] AMENDOLA A, 1996, IEEE EURO VHDL 96 GE

[4] [Anonymous], IDDQ TESTING VLSI CI

[5] [Anonymous], P IEEE INT TEST C

[6] [Anonymous], 1998, COMPUTER ORG DESIGN

[7] AUER A, SCHALTUNGSTEST BOUND

[8] BEHLING A, 2000, THESIS BTU COTTBUS G

[9] Benso A., 1998, Annual Reliability and Maintainability Symposium 1998 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.98CH36161), P383, DOI 10.1109/RAMS.1998.653808

[10] BENSO A, 1998, J UNIVERS COMPUT SCI, V5, P693