Review of thermal boundary resistance of high-temperature superconductors

被引:18
作者
Prasher, RS [1 ]
Phelan, PE [1 ]
机构
[1] Arizona State Univ, Tempe, AZ 85287 USA
来源
JOURNAL OF SUPERCONDUCTIVITY | 1997年 / 10卷 / 05期
基金
美国国家科学基金会;
关键词
thermal boundary resistance; high-temperature superconductors;
D O I
10.1007/BF02767682
中图分类号
O59 [应用物理学];
学科分类号
摘要
Solid-solid thermal boundary resistance plays an important role in the thermal stability of many electronic circuits, microdevices, and superconducting devices. The thermal boundary resistance (R-b) at any interface causes a temperature discontinuity, which can result in heat accumulation on one side of the boundary and raise the temperature much above the stable region, causing device failure. With the advent of high-critical-temperature (high-T-c) superconductors, it is possible to make superconducting devices at practically achievable temperatures. As the current trend goes toward the development of more and more high-T-c superconducting devices, the need for a better understanding of the thermal boundary resistance of high-T-c superconductors becomes mandatory. This paper compiles all the theoretical and experimental work to date on R-b in high-T-c superconductors, both in thin-film and bulk forms, and provides a critical review of the cited works. This paper also describes the possible effect of the superconducting state on Rb for high-T-c superconductors, based on the experiments for both high-T-c and low-T-c bulk superconductors, and a possible explanation for these data based on the existing theory for low-T-c superconductors.
引用
收藏
页码:473 / 484
页数:12
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