High intensity electron cyclotron resonance proton source for low energy high intensity proton accelerator

被引:13
作者
Roychowdhury, P. [1 ]
Chakravarthy, D. P. [1 ]
机构
[1] Bhabha Atom Res Ctr, Accelerator & Pulse Power Div, Bombay 400085, Maharashtra, India
关键词
BEAM;
D O I
10.1063/1.3272786
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Electron cyclotron resonance (ECR) proton source at 50 keV, 50 mA has been designed, developed, and commissioned for the low energy high intensity proton accelerator (LEHIPA). Plasma characterization of this source has been performed. ECR plasma was generated with 400-1100 W of microwave power at 2.45 GHz, with hydrogen as working gas. Microwave was fed in the plasma chamber through quartz window. Plasma density and temperature was studied under various operating conditions, such as microwave power and gas pressure. Langmuir probe was used for plasma characterization using current voltage variation. The typical hydrogen plasma density and electron temperature measured were 7 x 10(11) cm(-3) and 6 eV, respectively. The total ion beam current of 42 mA was extracted, with three-electrode extraction geometry, at 40 keV of beam energy. The extracted ion current was studied as a function of microwave power and gas pressure. Depending on source pressure and discharge power, more than 30% total gas efficiency was achieved. The optimization of the source is under progress to meet the requirement of long time operation. The source will be used as an injector for continuous wave radio frequency quadrupole, a part of 20 MeV LEHIPA. The required rms normalized emittance of this source is less than 0.2 pi mm mrad. The simulated value of normalized emittance is well within this limit and will be measured shortly. This paper presents the study of plasma parameters, first beam results, and the status of ECR proton source. (C) 2009 American Institute of Physics. [doi:10.1063/1.3272786]
引用
收藏
页数:8
相关论文
共 15 条
[1]   Emittance improvement of the electron cyclotron resonance high intensity light ion source proton beam by gas injection in the low energy beam transport [J].
Beauvais, PY ;
Ferdinand, R ;
Gobin, R ;
Lagniel, JM ;
Leroy, PA ;
Celona, L ;
Ciavola, G ;
Gammino, S ;
Pottin, B ;
Sherman, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (03) :1413-1416
[2]  
BEAUVAIS PY, 1997, P 1997 PART AC UNPUB, P2720
[3]  
Boers J. E., 1995, Proceedings of the 1995 Particle Accelerator Conference (Cat. No.95CH35843), P2312, DOI 10.1109/PAC.1995.505535
[4]   Status of the trasco intense proton source and emittance measurements [J].
Celona, L ;
Ciavola, G ;
Gammino, S ;
Chines, F ;
Presti, M ;
Andò, L ;
Guo, XH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05) :1423-1426
[5]  
Chen F.F., 1965, Plasma Diagnostics Techniques
[6]   STUDY OF ION-BEAM INTENSITY AND DIVERGENCE OBTAINED FROM A SINGLE APERTURE 3 ELECTRODE EXTRACTION SYSTEM [J].
COUPLAND, JR ;
GREEN, TS ;
HAMMOND, DP ;
RIVIERE, AC .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) :1258-1270
[7]  
FERDINAND R, 1997, P 1997 PART AC UNPUB, P83002
[8]   Enhancement of ion current from the TRIPS source by means of different electron donors [J].
Gammino, S ;
Ciavola, G ;
Celona, L ;
Torrisi, L ;
Mascali, D ;
Passarello, S ;
Galatà, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03)
[9]   High intensity ECR ion source (H+, D+, H-) developments at CEA/Saclay [J].
Gobin, R ;
Beauvais, PY ;
Bogard, D ;
Charruau, G ;
Delferrière, O ;
De Menezes, D ;
France, A ;
Ferdinand, R ;
Gauthier, Y ;
Harrault, F ;
Jannin, JL ;
Lagniel, JM ;
Leroy, PA ;
Mattéi, P ;
Sherman, J ;
Sinanna, A ;
Ausset, P ;
Bousson, S ;
Pottin, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (02) :922-924
[10]   Status and new developments of the high intensity electron cyclotron resonance source light ion continuous wave, and pulsed mode (invited) [J].
Lagniel, JM ;
Beauvais, PY ;
Bogard, D ;
Bourdelle, G ;
Charruau, G ;
Delferrière, O ;
De Menezes, D ;
France, A ;
Ferdinand, R ;
Gauthier, Y ;
Gobin, R ;
Harrault, F ;
Jannin, JL ;
Leroy, PA ;
Yao, I ;
Ausset, P ;
Pottin, B ;
Rouvière, N ;
Celona, L ;
Gammino, S .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02) :830-835