Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision

被引:1
作者
Pellin, Michael J. [1 ,2 ,3 ]
Veryovkin, Igor V. [1 ,2 ]
Levine, Jonathan [1 ,2 ,3 ]
Zinovev, Alexander [1 ,2 ]
Davis, Andrew M. [1 ,2 ,3 ,4 ]
Stephan, Thomas [1 ,2 ,3 ]
Tripa, C. Emil [1 ,2 ]
King, Bruce V. [1 ,5 ]
Savina, Michael R. [1 ,2 ]
机构
[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[2] Chicago Ctr Cosmochem, Chicago, IL 60637 USA
[3] Univ Chicago, Dept Geophys Sci, Chicago, IL 60637 USA
[4] Univ Chicago, Enrico Fermi Inst, Chicago, IL 60637 USA
[5] Univ Newcastle, Sch Math & Phys Sci, Callaghan, NSW 2308, Australia
关键词
resonant ionization mass spectrometry; isotopic analysis; depth profiling; useful yield; RIMS; cosmochemistry; isotopic precision; elemental composition; photoionization; DYNAMIC-RANGE; SIMS; DIFFUSION;
D O I
10.1255/ejms.1085
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
There are four generally mutually exclusive requirements that plague many mass spectrometric measurements of trace constituents: (1) the small size (limited by the depth probed) of many interesting materials requires high useful yields to simply detect some trace elements, (2) the low concentrations of interesting elements require efficient discrimination from isobaric interferences, (3) it is often necessary to measure the depth distribution of elements with high surface and low bulk contributions, and (4) many applications require precise isotopic analysis. Resonant ionization mass spectrometry has made dramatic progress in addressing these difficulties over the past five years.
引用
收藏
页码:373 / 377
页数:5
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