Near-field acoustical holography (NAH) is an efficient noise diagnosis method with the deficiencies including wraparound error, which will increase when the spatial sampling rate is reduced below the minimum specified by Shannon-Nyquist theorem. Based on 3D convolutional neural network (3D-CNN) and stacked autoencoder (SAE), a method called CSA-NAH is proposed to reduce the wraparound error under sparse measuring. Subsequently, numerical calculations are carried out to illustrate the feasibility and performance of CSA-NAH. The results show that when holographic measurement point number is 64, average reconstruction error of CSA-NAH on an aluminum plate for sound pressure within 2000 Hz is 4.32%, while the latest existing methods is greater than 10%. For error in 1200 Hz similar to 2000 Hz, the error is reduced from more than 15% of the existing methods to 5.5%. Therefore, the application of the proposed CSA-NAH can cut down the measuring cost by reducing the number of microphones without wraparound error.
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UPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Chardon, Gilles
Daudet, Laurent
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UPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Daudet, Laurent
Peillot, Antoine
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UPMC Univ Paris 06, UMR 7190, Inst Jean Rond dAlembert, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Peillot, Antoine
Ollivier, Francois
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UPMC Univ Paris 06, UMR 7190, Inst Jean Rond dAlembert, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Ollivier, Francois
Bertin, Nancy
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CNRS, IRISA UMR 6074, F-35042 Rennes, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Bertin, Nancy
Gribonval, Remi
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INRIA, Ctr Inria Rennes, F-35042 Rennes, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
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UPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Chardon, Gilles
Daudet, Laurent
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UPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Daudet, Laurent
Peillot, Antoine
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h-index: 0
机构:
UPMC Univ Paris 06, UMR 7190, Inst Jean Rond dAlembert, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Peillot, Antoine
Ollivier, Francois
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h-index: 0
机构:
UPMC Univ Paris 06, UMR 7190, Inst Jean Rond dAlembert, F-75005 Paris, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Ollivier, Francois
Bertin, Nancy
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h-index: 0
机构:
CNRS, IRISA UMR 6074, F-35042 Rennes, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France
Bertin, Nancy
Gribonval, Remi
论文数: 0引用数: 0
h-index: 0
机构:
INRIA, Ctr Inria Rennes, F-35042 Rennes, FranceUPMC Univ Paris 06, Univ Paris Diderot, ESPCI ParisTech, Inst Langevin,CNRS UMR 7587, F-75005 Paris, France