Comparison of high voltage and high temperature performances of wide bandgap semiconductors for vertical power devices

被引:76
作者
Raynaud, Christophe [1 ]
Tournier, Dominique [1 ]
Morel, Herve [1 ]
Planson, Dominique [1 ]
机构
[1] Univ Lyon, CNRS, UMR 5005, INSA Lyon,Lab Ampere, F-69621 Villeurbanne, France
关键词
Wide bandgap; Power semiconductor devices; Semiconductor materials; IMPACT IONIZATION; NITROGEN DONORS; BREAKDOWN VOLTAGE; ELECTRON-MOBILITY; JBS DIODES; ENERGY-GAP; DIAMOND; 4H; KV; DEPENDENCE;
D O I
10.1016/j.diamond.2009.09.015
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature dependent properties of wide bandgap semiconductors have been used to calculate theoretical specific on-resistance. breakdown voltage, and thermal run-away temperature in SiC GaN, diamond, and Si vertical power devices for comparison It appears mainly that diamond is interesting for high power devices for high temperature applications. At room temperature, diamond power devices should be superior to SiC only for voltage higher than 30-40 kV due to the high energy activation of the dopants (C) 2009 Elsevier B.V. All rights reserved
引用
收藏
页码:1 / 6
页数:6
相关论文
共 58 条
  • [11] ABSORPTION OF LIGHT IN ALPHA SIC NEAR THE BAND EDGE
    CHOYKE, WJ
    PATRICK, L
    [J]. PHYSICAL REVIEW, 1957, 105 (06): : 1721 - 1723
  • [12] IONIZATION RATES FOR ELECTRONS AND HOLES IN SILICON
    CHYNOWETH, AG
    [J]. PHYSICAL REVIEW, 1958, 109 (05): : 1537 - 1540
  • [14] Electronic properties of zinc-blende GaN, AlN, and their alloys Ga1-xAlxN
    Fan, WJ
    Li, MF
    Chong, TC
    Xia, JB
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (01) : 188 - 194
  • [15] THE ELECTRICAL-PROPERTIES AND DEVICE APPLICATIONS OF HOMOEPITAXIAL AND POLYCRYSTALLINE DIAMOND FILMS
    GILDENBLAT, GS
    GROT, SA
    BADZIAN, A
    [J]. PROCEEDINGS OF THE IEEE, 1991, 79 (05) : 647 - 668
  • [16] NITROGEN DONORS IN 4H-SILICON CARBIDE
    GOTZ, W
    SCHONER, A
    PENSL, G
    SUTTROP, W
    CHOYKE, WJ
    STEIN, R
    LEIBENZEDER, S
    [J]. JOURNAL OF APPLIED PHYSICS, 1993, 73 (07) : 3332 - 3338
  • [17] Gotz W, 1996, APPL PHYS LETT, V68, P3144, DOI 10.1063/1.115805
  • [18] HARRIS GL, 1995, PROPERTIES SILICON C, P74
  • [19] 5 kV, 9.5 A SiC JBS Diodes with Non-uniform Guard Ring Edge Termination for High Power Switching Application
    Hu, Jun
    Li, Larry X.
    Alexandrov, Petre
    Wang, Xiaohui
    Zhao, Jian H.
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 947 - +
  • [20] Development of Large Area (up to 1.5 cm2) 4H-SiC 10 kV Junction Barrier Schottky Rectifiers
    Hull, Brett A.
    Sumakeris, Joseph J.
    O'Loughlin, Michael J.
    Zhang, Qingchun
    Richmond, Jim
    Powell, Adrian
    Paisley, Mike
    Tsvetkov, Valeri
    Hefner, Allen
    Rivera, Angel
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 931 - +