Study of Low Power Deposition of ITO for Top Emission OLED with Facing Target and RF sputtering Systems

被引:10
作者
Dangtip, S. [1 ]
Hoshi, Y. [2 ]
Kasahara, Y. [2 ]
Onai, Y.
Osotchan, T. [1 ,2 ]
Sawada, Y.
Uchida, T.
机构
[1] Mahidol Univ, Fac Sci, Dept Phys, Bangkok 10400, Thailand
[2] Tokyo Polytech Univ, Kanagawa 2430297, Japan
来源
PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY | 2008年 / 100卷
基金
日本学术振兴会;
关键词
D O I
10.1088/1742-6596/100/4/042011
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Deposition of ITO as top transparent electrode was studied using two deposition systems with and without direct contact to working plasma; namely with conventional RF-magnetron planar (RSS) and pulsed-DC facing target sputtering systems (FTS). Test devices were made on glass substrates and consisted of ( from bottom up) ITO/4 Organic Layers/ITO. Depositions were performed at low deposition powers; 30 and 60 watts, to reduce damages by energetic sputtered particles to underlying organic layers. Test devices from both sputtering systems were found to function well. Leakage current density at -5 V reverse bias were relatively constant from 0.3 and 0.4 mA/cm(2) at 30 W and 60 W in FTS, while the values were found to increase from 0.001 to 0.2 mA/cm(2) at 30 W and 60 W in RSS.
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页数:6
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