How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs

被引:34
作者
Libano, F. [1 ]
Rech, P. [2 ]
Neuman, B. [3 ]
Leavitt, J. [4 ]
Wirthlin, M. [4 ]
Brunhaver, J. [1 ]
机构
[1] Arizona State Univ ASU, Sch Elect Comp & Energy Engn ECEE, Tempe, AZ 85287 USA
[2] Fed Univ Rio Grande Sul UFRGS, Inst Informat, BR-91501970 Porto Alegre, RS, Brazil
[3] Los Alamos Natl Lab LANL, Los Alamos, NM 87544 USA
[4] Brigham Young Univ BYU, Dept Elect & Comp Engn, Provo, UT 84602 USA
关键词
Field programmable gate arrays; Biological neural networks; Reliability; Parallel processing; Quantization (signal); Sensitivity; Resource management; Field-programmable gate array (FPGA); neural networks; parallelism; reduced precision; reliability; SYSTEMS; PLANAR;
D O I
10.1109/TNS.2021.3050707
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Convolutional neural networks (CNNs) are becoming attractive alternatives to traditional image-processing algorithms in self-driving vehicles for automotive, military, and aerospace applications. The high computational demand of state-of-the-art CNN architectures requires the use of hardware acceleration on parallel devices. Field-programmable gate arrays (FPGAs) offer a great level of design flexibility, low power consumption, and are relatively low cost, which make them very good candidates for efficiently accelerating neural networks. Unfortunately, the configuration memories of SRAM-based FPGAs are sensitive to radiation-induced errors, which can compromise the circuit implemented on the programmable fabric and the overall reliability of the system. Through neutron beam experiments, we evaluate how lossless quantization processes and subsequent data precision reduction impact the area, performance, radiation sensitivity, and failure rate of neural networks on FPGAs. Our results show that an 8-bit integer design can deliver over six times more fault-free executions than a 32-bit floating-point implementation. Moreover, we discuss the tradeoffs associated with varying degrees of parallelism in a neural network accelerator. We show that, although increased parallelism increases radiation sensitivity, the performance gains generally outweigh it in terms of global failure rate.
引用
收藏
页码:865 / 872
页数:8
相关论文
共 42 条
[1]  
Aldahlawi A, 2019, INT SOC DESIGN CONF, P247, DOI [10.1109/isocc47750.2019.9027715, 10.1109/ISOCC47750.2019.9027715]
[2]  
Andersch M, 2015, INT SYM PERFORM ANAL, P169, DOI 10.1109/ISPASS.2015.7095801
[3]  
Benevenuti F., 2018, P 31 S INT CIRC SYST, P164
[4]   Benchmark Analysis of Representative Deep Neural Network Architectures [J].
Bianco, Simone ;
Cadene, Remi ;
Celona, Luigi ;
Napoletano, Paolo .
IEEE ACCESS, 2018, 6 :64270-64277
[5]   Analyzing and Increasing the Reliability of Convolutional Neural Networks on GPUs [J].
dos Santos, Fernando Fernandes ;
Pimenta, Pedro Foletto ;
Lunardi, Caio ;
Draghetti, Lucas ;
Carro, Luigi ;
Kaeli, David ;
Rech, Paolo .
IEEE TRANSACTIONS ON RELIABILITY, 2019, 68 (02) :663-677
[6]   Reliability Evaluation of Mixed-Precision Architectures [J].
dos Santos, Fernando Fernandes ;
Lunardi, Caio ;
Oliveira, Daniel ;
Libano, Fabiano ;
Rech, Paolo .
2019 25TH IEEE INTERNATIONAL SYMPOSIUM ON HIGH PERFORMANCE COMPUTER ARCHITECTURE (HPCA), 2019, :238-249
[7]   Evaluation and Mitigation of Soft-Errors in Neural Network-based Object Detection in Three GPU Architectures [J].
dos Santos, Fernando Fernandes ;
Draghetti, Lucas ;
Weigel, Lucas ;
Carro, Luigi ;
Navaux, Philippe ;
Rech, Paolo .
2017 47TH ANNUAL IEEE/IFIP INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS WORKSHOPS (DSN-W 2017), 2017, :169-176
[8]  
dos SantosF.F., 2019, 2019 IEEE European Test Symposium (ETS), P127
[9]   On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA [J].
Du, Boyang ;
Azimi, Sarah ;
De Sio, Corrado ;
Bozzoli, Ludovica ;
Sterpone, Luca .
2019 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT), 2019,
[10]   Neutron-Induced Charge Collection Simulation of Bulk FinFET SRAMs Compared With Conventional Planar SRAMs [J].
Fang, Yi-Pin ;
Oates, Anthony S. .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2011, 11 (04) :551-554