X-ray diffraction radiation from ultra-relativistic charged particles

被引:9
作者
Zhevago, NK [1 ]
Glebov, VI [1 ]
机构
[1] Russian Res Ctr, IV Kurchatov Atom Energy Inst, Moscow 123182, Russia
关键词
relativistic electron and positron beams; nanocrystalline materials; wave fronts and ray tracing; fullerenes; nanotubes; diffraction; channeling; X-ray radiation;
D O I
10.1016/S0375-9601(03)00019-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present the theory of the X-ray radiation arising from the diffraction of electromagnetic field of fast charged particles on structures with relatively large spatial period. The role of the dynamical diffraction effects is discussed. It is shown that at small enough angles of particle incidence upon nanotube or capillary bundle a new kind of radiation may arise associated with X-ray channeling. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:311 / 319
页数:9
相关论文
共 19 条
[1]  
AFANASIEV AM, 1978, ZH EKSP TEOR FIZ+, V74, P570
[2]   DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].
BATTERMAN, BW ;
COLE, H .
REVIEWS OF MODERN PHYSICS, 1964, 36 (03) :681-&
[3]   How narrow is the linewidth of parametric x-ray radiation? [J].
Brenzinger, KH ;
Limburg, B ;
Backe, H ;
Dambach, S ;
Euteneuer, H ;
Hagenbuck, F ;
Herberg, C ;
Kaiser, KH ;
Kettig, O ;
Kube, G ;
Lauth, W ;
Schope, H ;
Walcher, T .
PHYSICAL REVIEW LETTERS, 1997, 79 (13) :2462-2465
[4]   FOCUSING OF X-RAYS USING TAPERED WAVE-GUIDES [J].
DENISOV, EI ;
GLEBOV, VI ;
ZHEVAGO, NK .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 308 (1-2) :400-404
[5]  
Dresselhaus M. S., 1996, SCI FULLERENES CARBO
[6]  
GLEBOV VI, 1989, FIZ TVERD TELA, V131, P275
[7]  
HENKE BL, 1982, ATOM DATA, V27, P3
[8]   A FINE-STRUCTURE OF PARAMETRIC X-RAY-RADIATION FROM RELATIVISTIC ELECTRONS IN A CRYSTAL [J].
SHCHAGIN, AV ;
PRISTUPA, VI ;
KHIZHNYAK, NA .
PHYSICS LETTERS A, 1990, 148 (8-9) :485-488
[9]   SIMPLE METHOD FOR FOCUSING X-RAYS USING TAPERED CAPILLARIES [J].
STERN, EA ;
KALMAN, Z ;
LEWIS, A ;
LIEBERMAN, K .
APPLIED OPTICS, 1988, 27 (24) :5135-5139
[10]  
TERMIKAELYAN ML, 2001, USP FIZ NAUK, V171, P597