Risk assessment for heavy ions of parts tested with protons

被引:56
作者
O'Neill, PM [1 ]
Badhwar, GD [1 ]
Culpepper, WX [1 ]
机构
[1] NASA, Lyndon B Johnson Space Ctr, Houston, TX 77058 USA
关键词
D O I
10.1109/23.659052
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An internuclear cascade - evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm(2)/mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low earth orbit susceptibility to heavy ions.
引用
收藏
页码:2311 / 2314
页数:4
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