Stokes-vector and Mueller-matrix polarimetry [Invited]

被引:188
作者
Azzam, R. M. A. [1 ]
机构
[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
关键词
OF-AMPLITUDE PHOTOPOLARIMETER; IN-LINE POLARIMETER; 4-DETECTOR PHOTOPOLARIMETER; POLARIZATION STATE; SPECTROSCOPIC ELLIPSOMETRY; SYNCHROTRON-RADIATION; IMAGING POLARIMETRY; MONOCHROMATIC LIGHT; CONICAL DIFFRACTION; OPTICAL-ELEMENTS;
D O I
10.1364/JOSAA.33.001396
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper reviews the current status of instruments for measuring the full 4 x 1 Stokes vector S, which describes the state of polarization (SOP) of totally or partially polarized light, and the 4 x 4 Mueller matrix M, which determines how the SOP is transformed as light interacts with a material sample or an optical element or system. The principle of operation of each instrument is briefly explained by using the Stokes-Mueller calculus. The development of fast, automated, imaging, and spectroscopic instruments over the last 50 years has greatly expanded the range of applications of optical polarimetry and ellipsometry in almost every branch of science and technology. Current challenges and future directions of this important branch of optics are also discussed. (C) 2016 Optical Society of America
引用
收藏
页码:1396 / 1408
页数:13
相关论文
共 150 条
[1]   Three-dimensional polarization control in microscopy [J].
Abouraddy, AF ;
Toussaint, KC .
PHYSICAL REVIEW LETTERS, 2006, 96 (15)
[2]   Measurement of the polarization state of light using an integrated plasmonic polarimeter [J].
Afshinmanesh, Farzaneh ;
White, Justin S. ;
Cai, Wenshan ;
Brongersma, Mark L. .
NANOPHOTONICS, 2012, 1 (02) :125-129
[3]  
AKERLIND C, 2015, APPL OPTICS, V54, P6037, DOI DOI 10.1364/AO.54.006037
[4]   All-fiber acousto-optic polarization monitor [J].
Alhassen, Fares ;
Boss, Matthew R. ;
Huang, Rong ;
Lee, Henry P. ;
Dashti, Pedram Z. .
OPTICS LETTERS, 2007, 32 (07) :841-843
[5]  
[Anonymous], 2014, POLARISATION APPL RE
[6]  
[Anonymous], 1851, Transactions of the Cambridge Philosophical Society, DOI [DOI 10.1017/CBO9780511702266.010, 10.1017/CBO9780511702266.010]
[7]  
[Anonymous], 2004, INFRARED ELLIPSOMETR
[8]  
[Anonymous], HDB OPTICS
[9]  
[Anonymous], 2004, Polarimetric Doppler Weather Radar: Principles and Applications
[10]   Useful Mueller matrix symmetries for ellipsometry [J].
Arteaga, Oriol .
THIN SOLID FILMS, 2014, 571 :584-588