Low temperature neutron diffraction studies on Bi4Ti3O12

被引:12
作者
Chakraborty, Keka R.
Achary, S. N.
Patwe, S. J.
Krishna, P. S. R.
Shinde, A. B.
Tyagi, A. K. [1 ]
机构
[1] Bhabha Atom Res Ctr, Div Appl Chem, Bombay 400085, Maharashtra, India
[2] Bhabha Atom Res Ctr, Solid State Phys Div, Bombay 400085, Maharashtra, India
关键词
bismuth titanate; neutron diffraction; crystal structure;
D O I
10.1016/j.ceramint.2005.11.010
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The detailed crystal structure of Bi4Ti3O12 obtained by the Rietveld refinement of the powder neutron diffraction data in the temperature range of 300-15 K is being reported. At ambient temperature Bi4Ti3O12 has an orthorhombic structure (Space Group: B2cb) with unit cell parameters: a = 5.4432(5) angstrom, b = 5.4099(5) angstrom, c = 32.821(2) angstrom, and V = 966.5(1) angstrom(3). The low temperature neutron diffraction studies revealed the retention of the orthorhombic structure without any significant change in the atoms arrangement. A marginal decrease in the unit cell parameters is observed with the lowering of the temperature. (c) 2006 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
引用
收藏
页码:601 / 604
页数:4
相关论文
共 16 条
[1]   PHASE-TRANSITIONS AND IONIC-CONDUCTIVITY IN BI4V2O11 AN OXIDE WITH A LAYERED STRUCTURE [J].
ABRAHAM, F ;
DEBREUILLEGRESSE, MF ;
MAIRESSE, G ;
NOWOGROCKI, G .
SOLID STATE IONICS, 1988, 28 :529-532
[2]  
AURIVILLIUS B, 1949, ARK KEMI, V0001
[3]  
DORIAN JF, 1971, FERROELECTRICS, V3, P17
[4]  
Du YL, 2004, CHINESE PHYS LETT, V21, P1819, DOI 10.1088/0256-307X/21/9/040
[5]   THE CRYSTAL-CHEMISTRY AND DIELECTRIC-PROPERTIES OF THE AURIVILLIUS FAMILY OF COMPLEX BISMUTH OXIDES WITH PEROVSKITE-LIKE LAYERED STRUCTURES [J].
FRIT, B ;
MERCURIO, JP .
JOURNAL OF ALLOYS AND COMPOUNDS, 1992, 188 (1-2) :27-35
[6]   A variable-temperature powder neutron diffraction study of ferroelectric Bi4Ti3O12 [J].
Hervoches, CH ;
Lightfoot, P .
CHEMISTRY OF MATERIALS, 1999, 11 (11) :3359-3364
[7]   Combined structural refinement of Bi4Ti3O12 using X-ray and neutron powder diffraction data [J].
Kim, YI ;
Jeon, MK .
MATERIALS LETTERS, 2004, 58 (12-13) :1889-1893
[8]   STRUCTURAL BASIS OF FERROELECTRICITY IN BISMUTH TITANATE FAMILY [J].
NEWNHAM, RE ;
WOLFE, RW ;
DORRIAN, JF .
MATERIALS RESEARCH BULLETIN, 1971, 6 (10) :1029-&
[9]   Ferroelectric properties of intergrowth Bi4Ti3O12-SrBi4Ti4O15 ceramics [J].
Noguchi, Y ;
Miyayama, M ;
Kudo, T .
APPLIED PHYSICS LETTERS, 2000, 77 (22) :3639-3641
[10]   Lanthanum-substituted bismuth titanate for use in non-volatile memories [J].
Park, BH ;
Kang, BS ;
Bu, SD ;
Noh, TW ;
Lee, J ;
Jo, W .
NATURE, 1999, 401 (6754) :682-684