Subphthalocyanine film studied with spectroscopic ellipsometry

被引：14

作者：

Wang, Y ^{[1
]}

Gu, DH ^{[1
]}

Gan, FX ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China

来源：

OPTICS COMMUNICATIONS | 2000年 / 183卷 / 5-6期

基金：

中国国家自然科学基金;

关键词：

subphthalocyanine; thin film; ellipsometric spectra; optical constants; dielectric constants; absorption coefficient;

D O I：

10.1016/S0030-4018(00)00896-8

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new subphthalocyanine (bromoboron trinitro-subphthalocyanine) thin film was prepared by vacuum deposition on a single-crystal silicon substrate. The ellipsometric spectra of this film were investigated on an improved rotating analyzer-polarizer (RAP) type of scanning ellipsometer. The complex refractive index, dielectric constants, and absorption coefficient of this film in the wavelength range 400 to 700 nm were given. The spectra were explained and discussed. (C) 2000 Published by Elsevier Science B.V.

引用

页码：445 / 450

页数：6

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