A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder

被引：7

作者：

Namazi, Alireza ^{[1
]}

Sedaghat, Yasser ^{[1
]}

Miremadi, Seyed Ghassem ^{[1
]}

Ejlali, Alireza ^{[1
]}

机构：

[1] Sharif Univ Technol, Dependable Syst Lab, Dept Comp Engn, Tehran, Iran

来源：

2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM | 2009年

关键词：

Carry Look-Ahead Adder; Fault Tolerance; Single-Event Transient;

D O I：

10.1109/IOLTS.2009.5196019

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.

引用

页码：217 / 222

页数：6

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