Measurement of the optical dielectric function of monolayer transition-metal dichalcogenides: MoS2, MoSe2, WS2, and WSe2

被引:1133
作者
Li, Yilei [1 ,2 ]
Chernikov, Alexey [1 ,2 ]
Zhang, Xian [3 ]
Rigosi, Albert [1 ,2 ]
Hill, Heather M. [1 ,2 ]
van der Zande, Arend M. [3 ,4 ]
Chenet, Daniel A. [3 ]
Shih, En-Min [1 ,2 ]
Hone, James [3 ]
Heinz, Tony F. [1 ,2 ]
机构
[1] Columbia Univ, Dept Phys, New York, NY 10027 USA
[2] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[3] Columbia Univ, Dept Mech Engn, New York, NY 10027 USA
[4] Columbia Univ, Energy Frontier Res Ctr, New York, NY 10027 USA
基金
美国国家科学基金会;
关键词
KRAMERS-KRONIG ANALYSIS; LARGE-AREA; 2-DIMENSIONAL MATERIALS; REFLECTIVITY SPECTRA; VALLEY POLARIZATION; ATOMIC LAYERS; DIODES; GROWTH;
D O I
10.1103/PhysRevB.90.205422
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report a determination of the complex in-plane dielectric function of monolayers of four transition-metal dichalcogenides: MoS2, MoSe2, WS2, and WSe2, for photon energies from 1.5 to 3 eV. The results were obtained from reflection spectra using a Kramers-Kronig constrained variational analysis. From the dielectric functions, we obtain the absolute absorbance of the monolayers. We also provide a comparison of the dielectric function for the monolayers with the corresponding bulk materials.
引用
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页数:6
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