共 23 条
High-resolution micro-grating accelerometer based on a gram-scale proof mass
被引:25
作者:

Gao, Shan
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机构:
Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
Beihang Univ, Key Lab Inertial Sci & Technol, Beijing 100191, Peoples R China Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China

Zhou, Zhen
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机构:
Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
Beihang Univ, Key Lab Inertial Sci & Technol, Beijing 100191, Peoples R China Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China

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Deng, Keke
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机构:
Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
Beihang Univ, Key Lab Inertial Sci & Technol, Beijing 100191, Peoples R China Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China

Feng, Lishuang
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Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
Beihang Univ, Key Lab Inertial Sci & Technol, Beijing 100191, Peoples R China Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
机构:
[1] Beihang Univ, Minist Educ, Key Lab Micronano Measurement Manipulat & Phys, Beijing 100191, Peoples R China
[2] Beihang Univ, Key Lab Inertial Sci & Technol, Beijing 100191, Peoples R China
关键词:
OPTICAL DISPLACEMENT DETECTION;
SENSITIVITY;
D O I:
10.1364/OE.27.034298
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Micro-grating accelerometer detecting small displacement by an optical system can be widely applied in inertial navigation and seismic monitoring. We proposed a micro-grating accelerometer prototype with a proof mass of gram-scale to decrease the thermal mechanical noise, which is the fundamental limit of a high-resolution accelerometer. The theoretical model for the contrast ratio of a micro-grating accelerometer is established based on Gaussian beam theory, and the adjustment method based on a scanning slit beam profiler improves the contrast ratio of 0th order effectively. Compared to our former prototype, experiment results indicate the noise floor is decreased from 0.9 mg/root Hz to 137 mg/root Hz, and the bias stability is decreased from 0.35 mg to 3.1 mu g. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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页码:34299 / 34312
页数:14
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