A systematic study on effects of precursors and solvents for optimization of solution-processed oxide semiconductor thin-film transistors

被引:42
作者
Lim, Keon-Hee [1 ]
Lee, Jinwon [1 ]
Huh, Jae-Eun [1 ]
Park, Jintaek [1 ]
Lee, Jun-Hee [1 ]
Lee, Sung-Eun [1 ]
Kim, Youn Sang [1 ,2 ]
机构
[1] Seoul Natl Univ, Grad Sch Convergence Sci & Technol, Program Nano Sci & Technol, 1 Gwanak Ro, Seoul 08826, South Korea
[2] Adv Inst Convergence Technol, 145 Gwanggyo Ro, Suwon 16229, South Korea
基金
新加坡国家研究基金会;
关键词
LOW-TEMPERATURE; HIGH-PERFORMANCE; DEGENERATE CONDUCTION; MOBILITY; FABRICATION; GEL;
D O I
10.1039/c7tc01779k
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Solution-processed oxide semiconductor thin-film transistors (OS TFTs) have attracted much attention as a future display technology, because they have intrinsic properties such as flexibility and transparency as well as fabrication process advantages. Accordingly, to realize solution-processed high performance OS TFTs, various solutions have been developed. However, since it has been focused on the development of the solution itself, there have been no systematic approaches to independently study the effects of precursors and solvents for understanding and optimizing solution-processed OS TFTs. Here, we report a systematic study on the effects of precursors and solvents in solution-processed OS TFTs. Preferentially, InZnxOy (IZO) TFTs fabricated with various specific precursors and solvents are analyzed. It is confirmed that the electrical properties of IZO TFTs including field-effect mobility and V-on are strongly affected by the types of precursors and solvents. Through various analyses including the TFT model, and X-ray based analyses, we discover that changes in the electrical properties are related to changes in the physical and intrinsic film properties of IZO films depending on the types of precursors and solvents. With observation of trends in the changes, the effects of precursors and solvents were investigated to better understand and optimize solution-processed OS TFTs.
引用
收藏
页码:7768 / 7776
页数:9
相关论文
共 30 条
[1]  
Banger KK, 2011, NAT MATER, V10, P45, DOI [10.1038/nmat2914, 10.1038/NMAT2914]
[2]   Amorphous IZO TTFTs with saturation mobilities exceeding 100 cm2/Vs [J].
Fortunato, E. ;
Barquinha, P. ;
Pimentel, A. ;
Pereira, L. ;
Goncalves, G. ;
Martins, R. .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2007, 1 (01) :R34-R36
[3]   Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances [J].
Fortunato, E. ;
Barquinha, P. ;
Martins, R. .
ADVANCED MATERIALS, 2012, 24 (22) :2945-2986
[4]   Physical Modeling of Amorphous InGaZnO Thin-Film Transistors: The Role of Degenerate Conduction [J].
Ghittorelli, Matteo ;
Torricelli, Fabrizio ;
Kovacs-Vajna, Zsolt Miklos .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (06) :2417-2423
[5]   Analytical Physical-Based Drain-Current Model of Amorphous InGaZnO TFTs Accounting for Both Non-Degenerate and Degenerate Conduction [J].
Ghittorelli, Matteo ;
Torricelli, Fabrizio ;
Kovacs-Vajna, Zsolt Miklos .
IEEE ELECTRON DEVICE LETTERS, 2015, 36 (12) :1340-1343
[6]   Accurate Analytical Physical Modeling of Amorphous InGaZnO Thin-Film Transistors Accounting for Trapped and Free Charges [J].
Ghittorelli, Matteo ;
Torricelli, Fabrizio ;
Colalongo, Luigi ;
Kovacs-Vajna, Zsolt Miklos .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (12) :4105-4112
[7]   Low-Temperature, High-Performance, Solution-Processed Indium Oxide Thin-Film Transistors [J].
Han, Seung-Yeol ;
Herman, Gregory S. ;
Chang, Chih-hung .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2011, 133 (14) :5166-5169
[8]   An 'aqueous route' for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates [J].
Hwang, Young Hwan ;
Seo, Jin-Suk ;
Yun, Je Moon ;
Park, HyungJin ;
Yang, Shinhyuk ;
Park, Sang-Hee Ko ;
Bae, Byeong-Soo .
NPG ASIA MATERIALS, 2013, 5 :e45-e45
[9]   Transparent High-Performance Thin Film Transistors from Solution-Processed SnO2/ZrO2 Gel-like Precursors [J].
Jang, Jaewon ;
Kitsomboonloha, Rungrot ;
Swisher, Sarah L. ;
Park, Eung Seok ;
Kang, Hongki ;
Subramanian, Vivek .
ADVANCED MATERIALS, 2013, 25 (07) :1042-1047
[10]   Fundamentals of zinc oxide as a semiconductor [J].
Janotti, Anderson ;
Van de Walle, Chris G. .
REPORTS ON PROGRESS IN PHYSICS, 2009, 72 (12)