Long-term testing in a short-term world

被引：1
|
作者：
Rokosz, VT [1 ]
机构：
[1] IBM Corp, Software Grp, Armonk, NY 10504 USA
来源：
IEEE SOFTWARE | 2003年 / 20卷 / 03期
关键词：
D O I：
10.1109/MS.2003.1196323
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don't distort the system's operational profile.
引用
收藏
页码：64 / +
页数：5
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