Effect of a lattice-matched GaAsSb capping layer on the structural properties of InAs/InGaAs/InP quantum dots

被引:9
作者
Ulloa, J. M. [1 ]
Koenraad, P. M. [1 ]
Bonnet-Eymard, M. [2 ]
Letoublon, A. [2 ]
Bertru, N. [2 ]
机构
[1] Eindhoven Univ Technol, COBRA Inter Univ Res Inst, NL-5600 MB Eindhoven, Netherlands
[2] INSA Rennes, LENS, F-3543 Rennes, France
关键词
GROWTH; SHAPE;
D O I
10.1063/1.3361036
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of a lattice-matched GaAsSb capping layer on the structural properties of self-assembled InAs quantum dots (QDs) grown on InP substrates is studied on the atomic scale by cross-sectional scanning tunneling microscopy. While lattice-matched In0.53Ga0.47As-capped QDs are clearly truncated pyramids, GaAs0.51Sb0.49-capped QDs grown under the same conditions look like full pyramids and exhibit a larger height, indicating that capping with GaAsSb reduces dot decomposition. Since there are no differences in strain between the two capping layers, this behavior is most likely related to the surfactant effect of Sb, which stabilizes the growth front and avoids adatom migration. (C) 2010 American Institute of Physics. [doi:10.1063/1.3361036]
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页数:4
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