X-ray spectrometry using polycapillary X-ray optics and position sensitive detector

被引：18

作者：

Ding, XL ^{[1
]}

Xie, JD ^{[1
]}

He, YJ ^{[1
]}

Pan, QL ^{[1
]}

Yan, YM ^{[1
]}

机构：

[1] Beijing Normal Univ, Inst Low Energy Nucl Phys, Beijing Radiat Ctr, Beijing 100875, Peoples R China

来源：

TALANTA | 2000年 / 53卷 / 01期

关键词：

X-ray; polycapillary X-ray optics; MXRF; position sensitive X-ray spectrometry;

D O I：

10.1016/S0039-9140(00)00387-8

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Polycapillary X-ray optics (capillary X-ray lens) are now popular in X-ray fluorescence (XRF) analysis. Such an X-ray lens can collect X-rays emitted from an X-ray source in a large solid angle and form a very intense X-ray microbeam which is very convenient for microbeam X-ray fluorescence (MXRF) analysis giving low minimum detection limits (MDLs) in energy dispersive X-ray fluorescence (EDXRF). A new method called position sensitive X-ray spectrometry (PSXS) which combines an X-ray lens used to form an intense XRF source and a position sensitive detector (PSD) used for wavelength dispersive spectrometry (WDS) measurement was developed recently in the X-ray Optics Laboratory of Institute of Low Energy Nuclear Physics (ILENP) at Beijing Normal University. Such a method can give high energy and spacial resolution and high detection efficiency simultaneously. A short view of development of both the EDXRF using a capillary X-ray lens and the new PSXS is given in this paper. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：17 / 22

页数：6

共 13 条

[1] BUDNAR M, 1996, INT J PIXE, V6, P51
[2] DING X, 1999, ADV XRAY ANAL V41 DC
[3] DING XL, 1995, J BEIJING NORMAL U S, V31, P75
[4] HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROSCOPY FOR CHEMICAL-STATE ANALYSIS
FOLKMANN, F
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 75 (1-4) : 9 - 13
[5] BROAD RANGE X-RAY CRYSTAL SPECTROMETER
HITACHI, A
KUMAGAI, H
AWAYA, Y
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (03): : 631 - 634
[6] GRAZING-INCIDENCE X-RAY-FLUORESCENCE ANALYSIS
IIDA, A
SAKURAI, K
YOSHINAGA, A
GOHSHI, Y
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) : 736 - 738
[7] MULTIPLE REFLECTION FROM SURFACE X-RAY OPTICS
KUMAKHOV, MA
KOMAROV, FF
[J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1990, 191 (05): : 289 - 350
[8] MEADA K, 1996, INT J PIXE, V6, P117
[9] Xie JD, 1999, J ANAL ATOM SPECTROM, V14, P391
[10] YAN Y, 1998, ADV XRAY ANAL V40 CD

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