3-D stacked thin-film photodetectors for multispectral detection applications

被引:14
作者
Seo, SW [1 ]
Geddis, DL
Jokerst, NM
机构
[1] Georgia Inst Technol, Ctr Microelect Res, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
关键词
coarse wavelength-division multiplexing (CWDM); heterogeneous integration; integrated optoelectronics; multispectral detection; thin-film photodetectors;
D O I
10.1109/LPT.2003.809273
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To demonstrate simultaneous multispectral detection, short and long wavelength thin-film detectors, which are grown and optimized separately, are colocated and heterogeneously integrated in a three-dimensional (3-D) stack onto pads on an Si substrate. Simultaneous two-color detection by each detector in the 3-D stack has been measured and theoretically explored. This heterogeneous integration of two different detectors in a 3-D stack is an interesting physical integration technology for multispectral imaging systems and coarse wavelength-division-multiplexing systems.
引用
收藏
页码:578 / 580
页数:3
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