Broadband millimeter-wave anti-reflection coatings on silicon using pyramidal sub-wavelength structures

被引:38
作者
Young, Karl [1 ,2 ]
Wen, Qi [1 ,2 ]
Hanany, Shaul [1 ,2 ]
Imada, Hiroaki [3 ]
Koch, Juergen [4 ]
Matsumura, Tomotake [5 ]
Suttmann, Oliver [4 ]
Schuetz, Viktor [4 ]
机构
[1] Univ Minnesota Twin Cities, Sch Phys & Astron, 116 Church St SE, Minneapolis, MN 55455 USA
[2] Univ Minnesota Twin Cities, Minnesota Inst Astrophys, 116 Church St SE, Minneapolis, MN 55455 USA
[3] Japan Aerosp Explorat Agcy JAXA, Inst Space & Astronaut Sci, Chuo Ku, 3-1-1 Yoshinodai, Sagamihara, Kanagawa 2525210, Japan
[4] Laser Zentrum Hannover eV, Hollerithallee 8, D-30419 Hannover, Germany
[5] Univ Tokyo, Todai Inst Adv Study, Kavli Inst Phys & Math Universe Kavli IPMU, WPI, 5-1-5 Kashiwa No Ha, Kashiwa, Chiba 2778583, Japan
关键词
LASER-ABLATION; DESIGN;
D O I
10.1063/1.4984892
中图分类号
O59 [应用物理学];
学科分类号
摘要
We used two novel approaches to produce sub-wavelength structure anti-reflection coatings on silicon for millimeter and sub-millimeter wave bands: picosecond laser ablation and dicing with beveled saws. We produced pyramidal structures with both techniques. The diced sample, machined on only one side, had a pitch and a height of 350 mu m and 972 mu m, respectively. The two laser ablated samples had a pitch of 180 mu m and heights of 720 mu m and 580 mu m; only one of these samples was ablated on both sides. We present measurements of shape and optical performances and comparisons to the optical performance predicted using finite element analysis and rigorous coupled wave analysis. By extending the measured performance of the one-sided diced sample to the two-sided case, we demonstrate a 25% band averaged reflectance of less than 5% over a bandwidth of 97% centered on 170 GHz. Using the two-sided laser ablation sample, we demonstrate a reflectance of less than 5% over a bandwidth of 83% centered on 346GHz. Published by AIP Publishing.
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页数:10
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