Modeling the effect of cultivar resistance on yield losses of winter wheat in natural multiple disease conditions

The use of winter wheat (Triticum aestivum L.) cultivars resistant to diseases may make it possible to reduce yield losses without the need to use fungicides, which are expensive and may damage the environment. The cultivar resistances favored depend on the region considered and the nature of the most widespread diseases in that region. We have constructed a statistical linear model for the estimation of relative yield loss due to diseases, making it possible to assess the effects of winter wheat cultivars in various disease conditions. We considered the interactions "potential disease intensity x winter wheat cultivar" for four main fungal diseases: septoria tritici blotch (Mycosphaerella graminicola), brown rust (Puccinia triticina), yellow rust (Puccinia striiformis) and powdery mildew (Erysiphe graminis). This model can therefore be readily adapted to different regions with diverse combinations of these diseases. The potential intensity of each disease in each trial was calculated based on the symptoms observed on susceptible cultivars not treated with fungicide. The cultivar effect was characterized by the ratings of cultivar susceptibility to each disease and by cultivar earliness. The parameters of the model were estimated from 276 wheat cultivar trials carried out over 12 years (1991-2002) in the major wheat-growing areas of France. This model can help to choose from the cultivars resistant to several diseases (but very rarely resistant to all the diseases), those cultivars best adapted to a given environment, according to the hierarchy of potential disease intensities encountered. (c) 2007 Elsevier B.V. All rights reserved.