Growth and characterization of epitaxially stabilized ceria(001) nanostructures on Ru(0001)

被引:21
作者
Flege, Jan Ingo [1 ,2 ]
Hoecker, Jan [1 ]
Kaemena, Bjoern [1 ]
Mentes, T. Onur [3 ]
Sala, Alessandro [3 ]
Locatelli, Andrea [3 ]
Gangopadhyay, Subhashis [4 ]
Sadowski, Jerzy T. [5 ]
Senanayake, Sanjaya D. [6 ]
Falta, Jens [1 ,2 ]
机构
[1] Univ Bremen, Inst Solid State Phys, Otto Hahn Allee 1, D-28359 Bremen, Germany
[2] Univ Bremen, MAPEX Ctr Mat & Proc, D-28359 Bremen, Germany
[3] Elettra Sincrotrone Trieste SCpA, SS 14 Km 163,5 AREA Sci Pk, I-34149 Trieste, Italy
[4] BITS Pilani, Dept Phys, Pilani 333031, Rajasthan, India
[5] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA
[6] Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA
关键词
CERIUM OXIDE LAYERS; ELECTRON-DIFFRACTION; THERMAL-PROPERTIES; DEFECT STRUCTURE; THIN-FILMS; CEO2; MORPHOLOGY; MICROSCOPY; OXIDATION; STATE;
D O I
10.1039/c6nr02393b
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have studied (001) surface terminated cerium oxide nanoparticles grown on a ruthenium substrate using physical vapor deposition. Their morphology, shape, crystal structure, and chemical state are determined by low-energy electron microscopy and micro-diffraction, scanning probe microscopy, and synchrotron-based X-ray absorption spectroscopy. Square islands are identified as CeO2 nanocrystals exhibiting a (001) oriented top facet of varying size; they have a height of about 7 to 10 nm and a side length between about 50 and 500 nm, and are terminated with a p(2 x 2) surface reconstruction. Micro-illumination electron diffraction reveals the existence of a coincidence lattice at the interface to the ruthenium substrate. The orientation of the side facets of the rod-like particles is identified as (111); the square particles are most likely of cuboidal shape, exhibiting (100) oriented side facets. The square and needle-like islands are predominantly found at step bunches and may be grown exclusively at temperatures exceeding 1000 degrees C.
引用
收藏
页码:10849 / 10856
页数:8
相关论文
共 42 条
[1]   Pt-Mediated Reversible Reduction and Expansion of CeO2 in Pt Nanoparticle/Mesoporous CeO2 Catalyst: In Situ X-ray Spectroscopy and Diffraction Studies under Redox (H2 and O2) Atmospheres [J].
Alayoglu, Selim ;
An, Kwangjin ;
Melaet, Gerome ;
Chen, Shiyou ;
Bernardi, Fabiano ;
Wang, Lin Wang ;
Lindeman, Avery E. ;
Musselwhite, Nathan ;
Guo, Jinghua ;
Liu, Zhi ;
Marcus, Matthew A. ;
Somorjai, Gabor A. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2013, 117 (50) :26608-26616
[2]   THE GROWTH, STRUCTURE AND STABILITY OF CERIA OVERLAYERS ON PD(111) [J].
ALEXANDROU, M ;
NIX, RM .
SURFACE SCIENCE, 1994, 321 (1-2) :47-57
[3]   Room-temperature epitaxial growth of CeO2(001) thin films on Si(001) substrates by electron beam evaporation [J].
Ami, T ;
Ishida, Y ;
Nagasawa, N ;
Machida, A ;
Suzuki, M .
APPLIED PHYSICS LETTERS, 2001, 78 (10) :1361-1363
[4]   Electronic structure and valence state of CeAl2 from X-ray absorption and emission spectroscopy [J].
Dong, CL ;
Augustsson, A ;
Chen, CL ;
Chang, CL ;
Chen, YY ;
Guo, JH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2005, 144 :581-584
[5]   Growth and thermal properties of ultrathin cerium oxide layers on Rh(111) [J].
Eck, S ;
Castellarin-Cudia, C ;
Surnev, S ;
Ramsey, MG ;
Netzer, FP .
SURFACE SCIENCE, 2002, 520 (03) :173-185
[6]   LOW-ENERGY ELECTRON-DIFFRACTION PROFILE ANALYSIS OF REACTION-INDUCED SUBSTRATE CHANGES ON PT(110) DURING CATALYTIC CO OXIDATION [J].
FALTA, J ;
IMBIHL, R ;
SANDER, M ;
HENZLER, M .
PHYSICAL REVIEW B, 1992, 45 (12) :6858-6867
[7]   A new soft x-ray photoemission microscopy beamline at the National Synchrotron Light Source [J].
Flege, J. I. ;
Vescovo, E. ;
Nintzel, G. ;
Lewis, L. H. ;
Hulbert, S. ;
Sutter, P. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 261 (1-2) :855-858
[8]   Growth mode and oxidation state analysis of individual cerium oxide islands on Ru(0001) [J].
Flege, J. I. ;
Kaemena, B. ;
Senanayake, S. D. ;
Hoecker, J. ;
Sadowski, J. T. ;
Falta, J. .
ULTRAMICROSCOPY, 2013, 130 :87-93
[9]   Structural imaging of surface oxidation and oxidation catalysis on Ru(0001) [J].
Flege, J. I. ;
Hrbek, J. ;
Sutter, P. .
PHYSICAL REVIEW B, 2008, 78 (16)
[10]   Nanoscale Origin of Mesoscale Roughening: Real-Time Tracking and Identification of Three Distinct Ruthenium Oxide Phases in Ruthenium Oxidation [J].
Flege, Jan Ingo ;
Herd, Benjamin ;
Goritzka, Jan ;
Over, Herbert ;
Krasovskii, Eugene E. ;
Falta, Jens .
ACS NANO, 2015, 9 (08) :8468-8473