Nondestructive measurement of grain size in steel plate by X-ray diffraction

被引:3
|
作者
Ichikawa, F [1 ]
Okuno, M [1 ]
Okamoto, M [1 ]
Tanaka, F [1 ]
机构
[1] NIPPON STEEL CORP LTD, CHIBA 29912, JAPAN
来源
NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VII, PTS 1 AND 2 | 1996年 / 210-2卷
关键词
Debye-Scherrer ring; grain Size; nondestructive characterization; steel plate; texture; X-ray diffraction;
D O I
10.4028/www.scientific.net/MSF.210-213.195
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microstructural properties of steel products, such as their grain size and texture, are controlled in the steel industry to improve their quality. The characterization of microstructures by nondestructive methods has become increasingly important in recent years. The Committee on Sensors for Microstructure was organized by the Iron and Steel Institute of Japan to study nondestructive techniques for measuring grain size. One of these techniques, the x-ray diffraction technique, is discussed in this paper. Two x-ray diffraction techniques, the Debye-Scherrer camera method and the diffractometer method, were studied as means of estimating the grain size of steel plates. Various samples with different grain sizes, different metallurgical phases, and different degrees of texture were prepared for the experiments. The experimental results suggest that the grain size in a steel plate with a single ferritic phase can be estimated with an accuracy of better than +/-1 the ASTM number when there is little texture in the material. In addition, the presence of a secondary phase of pearlite or martensite can degrade the accuracy. Furthermore the grain size can be estimated accurately regardless of the degree of texture in the material if a suitable reflection plane is employed for the measurement.
引用
收藏
页码:195 / 202
页数:8
相关论文
共 50 条
  • [41] Basics of X-ray diffraction
    Stanjek, H
    Häusler, W
    HYPERFINE INTERACTIONS, 2004, 154 (1-4): : 107 - 119
  • [42] In Situ Observation of Crystal Grain Orientation During Scuffing Process of Steel Surface Using Synchrotron X-ray Diffraction
    K. Yagi
    T. Izumi
    J. Koyamachi
    S. Sanda
    S. Yamaguchi
    K. Satio
    M. Tohyama
    J. Sugimura
    Tribology Letters, 2020, 68
  • [43] In Situ Observation of Crystal Grain Orientation During Scuffing Process of Steel Surface Using Synchrotron X-ray Diffraction
    Yagi, K.
    Izumi, T.
    Koyamachi, J.
    Sanda, S.
    Yamaguchi, S.
    Satio, K.
    Tohyama, M.
    Sugimura, J.
    TRIBOLOGY LETTERS, 2020, 68 (04)
  • [44] LATTICE MISFIT MEASUREMENT IN INCONEL 625 BY X-RAY DIFFRACTION TECHNIQUE
    Sarkar, A.
    Mukherjee, P.
    Barat, P.
    Jayakumar, T.
    Mahadevan, S.
    Rai, Sanjay K.
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2008, 22 (23): : 3977 - 3985
  • [45] Measurement of residual stresses in CFRP laminates by X-ray diffraction method
    C Balasingh
    Vandana Singh
    Bulletin of Materials Science, 1997, 20 : 325 - 332
  • [46] X-ray diffraction measurement of stresses in post-tensioning tendons
    Carfagno, MG
    Noorai, FS
    Brauss, ME
    Pineault, JA
    NONDESTRUCTIVE EVALUATION OF BRIDGES AND HIGHWAYS, 1996, 2946 : 51 - 56
  • [47] Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
    Trofimov V.N.
    Karmanov V.V.
    Shiryaev A.A.
    Zvonov S.N.
    Russian Engineering Research, 2019, 39 (03) : 276 - 278
  • [48] Applications of X-ray diffraction technique in the residual stress measurement of films
    School of Materials Science and Engineering, Southeast University, Nanjing 211189, China
    不详
    Gongneng Cailiao, 2007, 11 (1745-1749): : 1745 - 1749
  • [49] X-ray diffraction by phase diffraction gratings
    Irzhak, D. V.
    Knyasev, M. A.
    Punegov, V. I.
    Roshchupkin, D. V.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 1159 - 1164
  • [50] Direction-dependent grain interaction in nickel and copper thin films, analysed by X-ray diffraction
    Kumar, A
    Welzel, U
    Mittemeijer, EJ
    ACTA MATERIALIA, 2006, 54 (05) : 1419 - 1430