Time-Based Sensing for Reference-Less and Robust Read in STT-MRAM Memories

This paper introduces the concept of time-based sensing (TBS) for bitcell read in spin transfer torque magnetic RAMs arrays. The TBS scheme converts the bitline voltage into time, then the sense amplifier discriminates the two bitcell levels in the time domain. The TBS scheme substantially improves the read yield compared to conventional voltage sensing (CVS). As further advantage, TBS requires no analog reference generation and distribution by leveraging the implicit timing reference set by the gate delay in the sense amplifier. Monte Carlo simulations in 65 nm show that the proposed TBS improves the read bit error rate (BER) by two-three orders of magnitude, compared to CVS. This is achieved at the cost of less than 1% area penalty and 13-14% performance degradation, and insignificant (2%) energy penalty when designed at iso-area (minimum delay). Compared to other sensing schemes at iso-BER, the proposed TBS scheme achieves a more favorable area-robustness-energy-performance tradeoff.