Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

被引：9
|
作者：
Bruce, S [1 ]
Vandamme, LKJ
Rydberg, A
机构：
[1] Uppsala Univ, SE-75120 Uppsala, Sweden
[2] Eindhoven Univ Technol, Dept Elect Engn, NL-5600 MB Eindhoven, Netherlands
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 2000年 / 47卷 / 09期
关键词：
amplifier; amplifier noise; correlation; transimpedance amplifier; voltage amplifier;
D O I：
10.1109/16.861592
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers.
引用
收藏
页码：1772 / 1773
页数：2
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