Analysis of SiGe/Si quantum dot superlattices grown by low-pressure chemical vapor deposition for thin solar cells

被引:15
|
作者
Lee, Minjoo Larry [1 ]
Dezsi, Geza [2 ]
Venkatasubramanian, Rama [2 ]
机构
[1] Yale Univ, Dept Elect Engn, New Haven, CT 06520 USA
[2] RTI Int, Ctr Solid State Energet, Res Triangle Pk, NC 27709 USA
关键词
SiGe; Quantum dots; Superlattices; Solar cells; Dislocations; LPCVD; GE-ISLANDS; SI; HETEROSTRUCTURES; MULTILAYERS; EFFICIENCY; SILICON;
D O I
10.1016/j.tsf.2009.10.060
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have grown SiGe/Si quantum dot superlattices (QDSLs) via low-pressure chemical vapor deposition (LPCVD) in order to analyze their performance as thin-film solar cells. Self-assembled SiGe quantum dots were included in the base region in order to increase absorption of near-infrared (NIR) photons and to increase short-circuit current density, J(sc). Rather than physically separate the epitaxial layers from the substrate prior to testing, a unique cell design was used to ensure that the epitaxial layers dominate the photocurrent from the cells. We found that open-circuit voltage V(oc) in our LPCVD-grown cells was comparable to that in earlier-reported cells grown by molecular beam epitaxy (MBE). The effect of both superlattice thickness and quantum dot density were also explored, and dislocations were found to sharply reduce V(oc) for thick superlattices with sufficiently-high dot density. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:S76 / S79
页数:4
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