Study of the evolution of basal plane dislocations during epitaxial growth: role of the surface kinetics

被引:7
作者
Camarda, M. [1 ]
La Magna, A. [1 ]
Canino, A. [1 ]
La Via, F. [1 ]
机构
[1] IMM, CNR, I-95121 Catania, Italy
来源
SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2 | 2010年 / 645-648卷
关键词
step-controlled epitaxy; extended defects; stacking faults; HOMOEPITAXIAL GROWTH;
D O I
10.4028/www.scientific.net/MSF.645-648.539
中图分类号
TB33 [复合材料];
学科分类号
摘要
In this article, using Kinetic Monte simulations on super-lattices, we study the evolution of extended defects during epitaxial growth. Specifically we show that, in the case of misoriented, close-packed substrates, a single-layer stacking fault can either extend throughout the entire epilayer (i.e. extended from the substrate up to the surface) or close in a dislocation loop depending on the deposition conditions and the crystallographic structure of the exposed surface containing the defect. We explain this behaviour in terms of a surface kinetic competition between the defect and the surrounding, perfect crystal: if the growth rate of the defect is higher compared to the growth rate of the surrounding crystal the defect will expand, otherwise it will close. This physical mechanism allows us to explain several experimental results of homo- and heteroepitaxy.
引用
收藏
页码:539 / 542
页数:4
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