Intensities and positions of resonance lines are calculated for the ferromagnetic resonance spectra of multilayer ferromagnetic films in a magnetic field oriented normally to the film surface. It is shown that the positions of spectral lines depend on the number of ferromagnetic layers, while the line intensities are determined by the phase shift between the oscillations of the magnetic moments of neighboring layers. A qualitative comparison is carried out between the results of calculations and the spectra observed in experiments. (C) 2002 MAIK "Nauka/Interperiodica".
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
van Stapele, R.P.
;
Greidanus, F.J.A.M.
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机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
Greidanus, F.J.A.M.
;
Smits, J.W.
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机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
van Stapele, R.P.
;
Greidanus, F.J.A.M.
论文数: 0引用数: 0
h-index: 0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth
Greidanus, F.J.A.M.
;
Smits, J.W.
论文数: 0引用数: 0
h-index: 0
机构:
Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, NethPhilips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth