The radiation effect on optical and morphological properties of Ag-As-Te thin films

被引:33
作者
Amin, G. A.
El-Sayed, S. M. [1 ]
Saad, H. M.
Hafez, F. M.
Abd-El-Rahman, M.
机构
[1] Natl Ctr Radiat Res & Technol, Cairo, Egypt
[2] Al Azhar Univ, Fac Sci, Cairo, Egypt
关键词
amorphous thin films; optical band gap; gamma irradiation; surface morphology;
D O I
10.1016/j.radmeas.2006.12.006
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
The effect of gamma irradiation on the features of AgxAs50-xTe50 with 3 <= x <= 20 films has been studied. The studies indicated that the films partially transform from the amorphous phase to a crystalline phase at low doses of gamma irradiation (0.5-3 kGy). The radiation effect on the optical spectrum of Ag-As-Te films has been studied on the deposited films before and after each radiation dose. It is found that the calculated optical band gap (E-g) decreases with increasing Ag content and at the same time decreases with the radiation dose up to 3 kGy. Increasing the radiation dose up to 3 kGy induces an indirect transition and consequently decreases the energy gap. This behavior is associated with the generation of excess electronic localized states. The surface morphology has been investigated with a scanning electron microscope (SEM). (c) 2007 Elsevier Ltd. All rights reserved.
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页码:400 / 406
页数:7
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