Determination of the alpha-Al2O3(0001) surface relaxation and termination by measurements of crystal truncation rods

被引：39

作者：

Guenard, P

Renaud, G

Barbier, A

GautierSoyer, M

机构：

来源：

APPLICATIONS OF SYNCHROTRON RADIATION TECHNIQUES TO MATERIALS SCIENCE III | 1996年 / 437卷

关键词：

D O I：

10.1557/PROC-437-15

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have investigated the unreconstructed (0001) surface structure of sapphire (alpha-Al2O3) by Grazing Incidence X-ray Scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surface. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

引用

页码：15 / 20

页数：6