Characterization of chrome layer formed by pulse plating

被引:20
作者
Choi, Y
Kim, M
Kwon, SC
机构
[1] Sunmoon Univ, Dept Met & Mat Engn, Chungnam 336840, South Korea
[2] Korea Inst Machinery & Mat, Kyungnam 641101, South Korea
关键词
pulse plating; protective layer; wear resistance; micro-hardness; residual stress;
D O I
10.1016/S0257-8972(03)00159-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Characterization of thin chrome layers prepared under various pulse plating conditions were systematically studied to improve their mechanical properties. The chrome was electro-deposited from an electrolyte bath containing 500 g l(-1) of chromic acid, 10 a l(-1) of sulfuric acid using direct current density of 1.6 mA mm(-2) and pulse currents with on-off time from 5 to 900 ms. The higher current density enhanced nucleation rate which resulted in refining grain size. The chrome growth kinetics determining nodule size and shape significantly depends on the duration of on-time rather than duration of off-time and on/off time ratio. Microstructural observation by TEM and micro-hardness measurement revealed that the reduction of wear resistance of the chrome deposited by pulse plating resulted from the grain size and residual stress relief during off-time. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:81 / 84
页数:4
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