Stability Study of Flexible 6,13-Bis(triisopropylsilylethynyl)pentacene Thin-Film Transistors with a Cross-Linked Poly(4-vinylphenol)/Yttrium Oxide Nanocomposite Gate Insulator

被引:12
作者
Kwon, Jin-Hyuk [1 ]
Zhang, Xue [2 ]
Piao, Shang Hao [3 ]
Choi, Hyoung Jin [3 ]
Bae, Jin-Hyuk [1 ]
Park, Jaehoon [2 ]
机构
[1] Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea
[2] Hallym Univ, Dept Elect Engn, Chunchon 24252, South Korea
[3] Inha Univ, Dept Polymer Sci & Engn, Inchon 22212, South Korea
基金
新加坡国家研究基金会;
关键词
polymeric insulator; stability; transistor; flexible electronics; nanocomposite; POLYMERIC DIELECTRICS;
D O I
10.3390/polym8030088
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
We investigated the electrical and mechanical stability of flexible 6,13-bis(triisopropylsilylehtynyl)pentacene (TIPS-pentacene) thin-film transistors (TFTs) that were fabricated on polyimide (PI) substrates using cross-linked poly(4-vinylphenol) (c-PVP) and c-PVP/yttrium oxide (Y2O3) nanocomposite films as gate insulators. Compared with the electrical characteristics of TIPS-pentacene TFTs with c-PVP insulators, the TFTs with c-PVP/Y2O3 nanocomposite insulators exhibited enhancements in the drain current and the threshold voltage due to an increase in the dielectric capacitance. In electrical stability experiments, a gradual decrease in the drain current and a negative shift in the threshold voltage occurred during prolonged bias stress tests, but these characteristic variations were comparable for both types of TFT. On the other hand, the results of mechanical bending tests showed that the characteristic degradation of the TIPS-pentacene TFTs with c-PVP/Y2O3 nanocomposite insulators was more critical than that of the TFTs with c-PVP insulators. In this study, the detrimental effect of the nanocomposite insulator on the mechanical stability of flexible TIPS-pentacene TFTs was found to be caused by physical adhesion of TIPS-pentacene molecules onto the rough surfaces of the c-PVP/Y2O3 nanocomposite insulator. These results indicate that the dielectric and morphological properties of polymeric nanocomposite insulators are significant when considering practical applications of flexible electronics operated at low voltages.
引用
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页数:9
相关论文
共 18 条
[1]   π-σ-Phosphonic Acid Organic Monolayer/Sol-Gel Hafnium Oxide Hybrid Dielectrics for Low-Voltage Organic Transistors [J].
Acton, Orb ;
Ting, Guy ;
Ma, Hong ;
Ka, Jae Won ;
Yip, Hin-Lap ;
Tucker, Neil M. ;
Jen, Alex K. -Y. .
ADVANCED MATERIALS, 2008, 20 (19) :3697-+
[2]   Low-voltage organic thin-film transistors with polymeric nanocomposite dielectrics [J].
Chen, Fang-Chung ;
Chuang, Chiao-Shun ;
Lin, Yung-Sheng ;
Kung, Li-Jen ;
Chen, Tung-Hsien ;
Shieh, Han-Ping D. .
ORGANIC ELECTRONICS, 2006, 7 (05) :435-439
[3]   Organic and polymer transistors for electronics [J].
Dodabalapur, Ananth .
MATERIALS TODAY, 2006, 9 (04) :24-30
[4]   Surface modifications of polyvinylidene fluoride (PVDF) under rf Ar plasma [J].
Duca, MD ;
Plosceanu, CL ;
Pop, T .
POLYMER DEGRADATION AND STABILITY, 1998, 61 (01) :65-72
[5]   The path to ubiquitous and low-cost organic electronic appliances on plastic [J].
Forrest, SR .
NATURE, 2004, 428 (6986) :911-918
[6]   Atomic layer deposited Al2O3 for gate dielectric and passivation layer of single-walled carbon nanotube transistors [J].
Kim, S. K. ;
Xuan, Y. ;
Ye, P. D. ;
Mohammadi, S. ;
Back, J. H. ;
Shim, Moonsub .
APPLIED PHYSICS LETTERS, 2007, 90 (16)
[7]   Ultralow-power organic complementary circuits [J].
Klauk, Hagen ;
Zschieschang, Ute ;
Pflaum, Jens ;
Halik, Marcus .
NATURE, 2007, 445 (7129) :745-748
[8]   Stable Bending Performance of Flexible Organic Light-Emitting Diodes Using IZO Anodes [J].
Kwak, Kiyeol ;
Cho, Kyoungah ;
Kim, Sangsig .
SCIENTIFIC REPORTS, 2013, 3
[9]   Effects of hydroxyl groups in polymeric dielectrics on organic transistor performance [J].
Lee, S ;
Koo, B ;
Shin, J ;
Lee, E ;
Park, H ;
Kim, H .
APPLIED PHYSICS LETTERS, 2006, 88 (16)
[10]   Effects of Interfacial Charge Depletion in Organic Thin-Film Transistors with Polymeric Dielectrics on Electrical Stability [J].
Park, Jaehoon ;
Bae, Jin-Hyuk ;
Kim, Won-Ho ;
Kim, Min-Hoi ;
Keum, Chang-Min ;
Lee, Sin-Doo ;
Choi, Jong Sun .
MATERIALS, 2010, 3 (06) :3614-3624