Characterization and design of two-dimensional electromagnetic band-gap structures by use of a full-wave method for diffraction gratings

被引:27
作者
Frezza, F
Pajewski, L
Schettini, G
机构
[1] Univ Roma La Sapienza, Dept Elect Engn, I-00184 Rome, Italy
[2] Roma Tre Univ Rome, Dept Appl Elect, I-00146 Rome, Italy
关键词
electromagnetic band-gap (EBG) materials; electromagnetic diffraction; gratings; periodic structures;
D O I
10.1109/TMTT.2003.808696
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, an accurate and efficient characterization of a two-dimensional (2-D) electromagnetic band-gap (EBG) structures is performed, which exploits a full-wave diffraction theory developed for one-dimensional diffraction gratings. EBG materials constituted by 2-D arrays of dielectric rods with arbitrary shape and lattice configuration are analyzed, and the transmission and reflection efficiencies are determined. The high convergence rate of the proposed technique is demonstrated. Results are presented for both TE and TM polarizations, showing the efficiencies as a function of frequency and physical parameters ters. Comparisons with other theoretical results reported in the literature are shown with a very, good agreement, and the authors theory is also favorably compared with available experimental data. Useful design contour plots are reported by which a very immediate and accurate visualization of the band-gap configurations can be obtained, and design formulas are also included. Finally, the behavioral differences when a periodical defect is present are also highlighted.
引用
收藏
页码:941 / 951
页数:11
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