A generic method for fault injection in circuits

被引：2

作者：

Faurax, Olivier ^{[1
,3
]}

Freund, Laurent ^{[1
]}

Tria, Assia ^{[2
]}

Muntean, Traian ^{[3
]}

Bancel, Frederic ^{[4
]}

机构：

[1] Lab SESAM, Ecole Mines St Etienne Site Georges Charpak, Avenue Des Anemones, F-13120 Gardanne, France

[2] CEA LETI, Lab SESAM, Avenue Des Anemones, F-13120 Gardanne, France

[3] Univ Mediterranee, Syst Informat Commun, F-13288 Marseille, France

[4] STMicroelect, Div Smartcard, Zone Ind Rousset, F-13106 Rousset, France

来源：

6TH INTERNATIONAL WORKSHOP ON SYSTEM-ON-CHIP FOR REAL-TIME APPLICATIONS, PROCEEDINGS | 2006年

关键词：

D O I：

10.1109/IWSOC.2006.348238

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Microcircuits dedicated to security in smartcards are targeted by more and more sophisticated attacks like fault attacks that combine physical disturbance and cryptanalysis. The use of simulation for circuit validation considering these attacks is limited by the time needed to compute the result of the chosen fault injections. Usually, this choice is made by the user according to his knowledge of the circuit functionnality. The aim of this paper is to propose a generic and semi-automatic method to reduce the number of fault injections using types of data stored in registers Oatch by latch).

引用

页码：211 / +

页数：3

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