Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave

被引:6
作者
Chung, Jaehun [1 ]
Kim, Kyeongtae [1 ]
Hwang, Gwangseok [1 ]
Kwon, Ohmyoung [1 ]
Lee, Joon Sik [2 ]
Park, Seung Ho [4 ]
Choi, Young Ki [3 ]
机构
[1] Korea Univ, Dept Mech Engn, Seoul 136701, South Korea
[2] Seoul Natl Univ, Sch Mech & Aerosp Engn, Seoul 151744, South Korea
[3] Chung Ang Univ, Sch Mech Engn, Seoul 156756, South Korea
[4] Hongik Univ, Dept Mech & Syst Design Engn, Seoul 121791, South Korea
关键词
distance measurement; nondestructive testing; photothermal effects; MICROSCOPY; HOLOGRAPHY; MECHANISMS;
D O I
10.1063/1.3422245
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The need for a subsurface imaging technique to locate and characterize subsurface defects in multidimensional micro- and nanoengineered devices has been growing rapidly. We show that a subsurface heater can be located accurately using the phase lag of a thermal wave. We deduce that the absolute phase lag is composed of four components. Among the four components, we isolate the component directly related to the position and the structure of the periodic heat source. We demonstrate that the position of the heater can be estimated accurately from the isolated phase lag component. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3422245]
引用
收藏
页数:4
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